CIMI: Image Sensor Research Team

Goiffon, Vincent and Magnan, Pierre and Martin-Gonthier, Philippe and Virmontois, Cédric and Gaillardin, Marc New source of random telegraph signal in CMOS image sensors. (2012) In: International Image Sensor Workshop, 08-11 June 2011, Hakodate-Onuma Prince Hotel, Hokaido, Japan.

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Place, Sébastien and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Estribeau, Magali and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. ( In Press: 2012) IEEE Transactions on Nuclear Science . ISSN 0018-9499

Martin-Gonthier, Philippe and Goiffon, Vincent and Magnan, Pierre In-Pixel source follower transistor RTS noise behavior under ionizing radiation in CMOS image sensors. ( In Press: 2012) IEEE Transactions on Electron Devices . ISSN 0018-9383

Goiffon, Vincent and Cervantes, Paola and Virmontois, Cédric and Corbière, Franck and Magnan, Pierre and Estribeau, Magali Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes. (2011) IEEE Transaction on Nuclear Sciences (n° 99). ISSN 0018-9499

Martin-Gonthier, Philippe and Magnan, Pierre Novel readout circuit architecture for CMOS image sensors minimizing RTS noise. (2011) IEEE Electron Device Letters, vol. 32 (n° 6). pp. 776 -778. ISSN 0741-3106

Goiffon, Vincent and Magnan, Pierre and Martin-Gonthier, Philippe and Virmontois, Cédric and Gaillardin, Marc Evidence of a novel source of random telegraph signal in CMOS image sensors. (2011) IEEE Electron Device Letters, vol. 32 (n° 6). pp. 773-775. ISSN 0741-3106

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2011) In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain.

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre Investigation of dark current random telegraph signal in pinned photodiode CMOS image sensors. (2011) In: IEEE International Electron Devices Meeting (IEDM 2011), 05-07 Dec 2011, Washington, USA.

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Girard, Sylvain and Petit, Sophie and Rolland, Guy and Bardoux, Alain Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors. (2011) IEEE Transactions on Nuclear Science, vol. 58 (n° 6). pp. 3085-3094. ISSN 0018-9499

Martin-Gonthier, Philippe and Magnan, Pierre and Corbière, Franck and Rolando, Sébastien and Saint-Pé, Olivier and Breart de Boisanger, M. and Larnaudie, Franck CMOS detectors for space applications: from R&D to operational program with large volume foundry. (2010) In: Sensors, Systems, and Next-Generation Satellites XIV, 20 Sept. 2010 , Toulouse, France.

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Girard, Sylvain and Paillet, Philippe Analysis of total dose-induced dark current in CMOS image sensors from interface state and trapped charge density measurements. (2010) IEEE Transactions on Nuclear Science, vol. 57 (n° 6). pp. 3087-3094. ISSN 0018-9499

Martin-Gonthier, Philippe and Havard, E. and Magnan, Pierre Custom transistor layout design techniques for random telegraph signal noise reduction in CMOS image sensors. (2010) IEEE Electronics Letters , vol. 46 (n° 19). pp. 1323 -1324. ISSN 0013-5194

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology. (2010) IEEE Transactions on Nuclear Science, vol. 57 (n° 6). pp. 3101-3108. ISSN 0018-9499

Martin-Gonthier, Philippe and Magnan, Pierre RTS noise impact in CMOS image sensors readout circuit. (2010) In: 16th IEEE International Conference on Electronics, Circuits, and Systems - ICECS 2009, 13-16 Dec 2009, Hammamet, Tunisia.

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Corbière, Franck and Estribeau, Magali and Pinel, Philippe Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes. (2010) In: SPIE Remote Sensing, 20 - 23 Sept 2010, Toulouse, France.

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Overview of ionizing radiation effects in image sensors fabricated in a deep-submicrometer CMOS imaging technology. (2009) IEEE Transactions on Electron Devices, vol. 5 (n° 11). pp. 2594 -2601. ISSN 0018-9383

Goiffon, Vincent and Hopkinson, Gordon R. and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier Multilevel RTS in proton irradiated CMOS image sensors manufactured in a deep submicron technology. (2009) IEEE Transactions on Nuclear Science, vol. 5 (n° 4). pp. 2132-2141 . ISSN 0018-9499

Djité, Ibrahima and Magnan, Pierre and Estribeau, Magali and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Theoretical evaluation of MTF and charge collection efficiency in CCD and CMOS image sensor. (2009) In: Optical Modeling and Performance Predictions IV : 5 - 6 August 2009, San Diego, California, United States. (Proceedings of the Spie ). Spie, Bellingham, United States. ISBN 978-0-8194-7717-0

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process. (2009) Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, vol. 610 (n° 1). pp. 225-229. ISSN 0168-9002

Virmontois, Cédric and Djité, Ibrahima and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Proton and g-ray irradiation on deep sub-micron processed CMOS image sensor. (2009) In: International symposium on reliability of optoelectronics for space (ISROS 2009), 11-15 May 2009, Cagliari, Italy.

Martin-Gonthier, Philippe and Magnan, Pierre Low-frequency noise impact on CMOS image sensors. (2009) In: 24th Conference on Design of Circuits and Integrated Systems - DCIS’09, 18-20 Nov 2009, Zaragoza, Spain.

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation. (2009) In: International Image Sensor Workshop, 25-28 June 2009, Bergen, Norway.

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Total dose evaluation of deep submicron CMOS imaging technology through elementary device and pixel array behavior analysis. (2008) IEEE Transactions on Nuclear Science, vol. 5 (n° 6). pp. 3494-3501. ISSN 0018-9499

Goiffon, Vincent and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier and Huger, Nicolas and Corbière, Franck Ionizing radiation effects on CMOS imagers manufactured in deep submicron process. (2008) In: SPIE Electronic Imaging 2008 : Sensors, Cameras, and Systems for Industrial/Scientific Applications IX, 27-31 Jan 2008, San Jose, United States.

Martin-Gonthier, Philippe and Magnan, Pierre and Corbière, Franck and Estribeau, Magali and Huger, Nicolas and Boucher, Luc Dynamic range optimisation of CMOS image sensors dedicated to space applications. (2007) In: Remote Sensing : Sensors, Systems, and Next-Generation Satellites XI, 17 Sep 2007, Florence, Italy.

Guilvard, Alexandre and Segura, Josep and Magnan, Pierre and Martin-Gonthier, Philippe A digital high-dynamic-range CMOS image sensor with multi-integration and pixel readout request. (2007) In: Electronic imaging : Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII, 28 Jan - 01 Feb 2007, San Jose, United States.

Guilvard, Alexandre and Magnan, Pierre and Segura, Josep and Martin-Gonthier, Philippe A high dynamic range digital LinLog CMOS image sensor architecture based on Event Readout of pixels and suitable for low voltage operation. (2007) In: 2007 International Image Sensor Workshop, 07-10 Jun 2007, Ogunquit Maine, United States.

Martin-Gonthier, Philippe and Corbière, Franck and Huger, Nicolas and Estribeau, Magali and Engel, Celine and Magnan, Pierre and Saint-Pé, Olivier Evaluation of radiation hardness design techniques to improve radiation tolerance for CMOS image sensors dedicated to space applications. (2006) In: AMICSA 2006 : The first International Workshop on Analog and Mixed-Signal Integrated Circuits for Space , 02-3 0Oct 2006, Xanthi, Greece.

Estribeau, Magali and Magnan, Pierre CMOS pixels crosstalk mapping and its influence on measurements accuracy for space applications. (2005) In: SPIE Remote Sensing 2005, 19 Sept 2005, Brugge, Belgium .

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Estribeau, Magali Space optical instruments optimisation thanks to CMOS image sensor technology. (2005) In: SPIE Remote Sensing 2005, 20 Sept 2005, Bruges, Belgium.

Estribeau, Magali and Magnan, Pierre Pixel Crosstalk and Correlation with Modulation Transfer Function of CMOS Image Sensor. (2005) In: SPIE Electronic Imaging 2005, 18 Jan 2005, San Jose, United States.

Martin-Gonthier, Philippe and Magnan, Pierre and Corbière, Franck Overview of CMOS process and design options for image sensor dedicated to space applications. (2005) In: SPIE Remote Sensing 2005, 19-22 Sept 2005, Brugge, Belgium.

Estribeau, Magali and Magnan, Pierre CMOS pixels crosstalk mapping and Modulation Transfer Function. (2005) In: IEEE CCD&AIS Workshop 2005, 09-11 June 2005, Nagano Prefecture, Japan.

Estribeau, Magali and Magnan, Pierre Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology. (2004) In: SPIE Remote Sensing 2004, 13 Sep 2004, Maspalomas, Gran Canarias, Spain.

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Belliot, Pierre and Estribeau, Magali Research-grade CMOS image sensors for remote sensing applications. (2004) In: SPIE Remote sensing 2004, 13 Sept 2004, Maspalomas, Gran Canarias, Spain.

Estribeau, Magali and Magnan, Pierre Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology. (2004) In: SPIE Optical System Design 2003, 30 Sept 2003, Saint-Etienne, France.

Larnaudie, Franck and Vignon, Bruno and Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Basolo, Stephanie Development of high-performances monolithic CMOS detectors for space applications. (2002) In: SPIE International Symposium on Optical Science, Engineering and Instrumentation, 07-11 Jul 2002, Seattle, United States.

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Vignon, Bruno and Magnan, Pierre and Farre, Jean and Corbière, Franck and Martin-Gonthier, Philippe High performances monolithic CMOS detectors for space applications. (2001) In: SPIE Remote Sensing 2001, 17-21 Sep 2001, Toulouse, France.

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors. In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain.